Masterarbeit, 2017
111 Seiten, Note: 9.00
CHAPTER
INTRODUCTION
RESIDUAL LIFE PREDICTIONOFELECTRONIC COMPONENTS
RESIDUAL LIFE PREDICTION OF ELECTROLYTIC CAPACITOR
Lifetime Acceleration Factors
RESIDUAL LIFE PREDICTION OF FIXED RESISTOR
Effects of Temperature on Life
Effects of operating voltage on Life
RESIDUAL LIFE PREDICTION OF DIODE
Effect of temperature on life
Effect of voltage on life
ARTIFICIAL INTELLIGENCE TECHNIQUES USED FOR RESIDUAL LIFE PREDICTION
Artificial neural network technique
Fuzzy Inference System
Adaptive Neuro-fuzzy Inference System (ANFIS)
CHAPTER
LITERATURE REVIEW
Salah-Al-Zubaidi, et.al:
Cherry Bhargava, et.al:
Salah Al-Zubaidi, et.al:
PrakashHPatil, et.al:
Zhigang Tian :
Seung Wu Lee, et.al:
Adithya Thaduri, et.al:
Garron KMorris, et.al:
Ajith Abraham, et.al:
Youmin Rong, et.al:
Prabhakar VVarde, et.al:
Vishu Madaan, et.al:
CHAPTER
REVIEW OF BASIC CONCEPTS AND DEVELOPMENT OF
Introduction
Outline of proposed work
Selection of components for life estimation
Methods for estimating the remaining useful life of electronic components
Experimental method (Using ALT)
Analytical method
Residual life estimation using artificial intelligence techniques
Artificial neural network technique
Fuzzy Inference System
Adaptive Neuro-fuzzy Inference System (ANFIS)
Design of decision support system
Tools Used:
MATLAB tool
Scope of the study
Residual life estimation using artificial intelligence techniques
Artificial neural network model
Fuzzy Inference System
Adaptive Neuro-fuzzy Inference System (ANFIS)
Design of fuzzy based decision support system
Modeling of fuzzy based decision support system
CHAPTER
WORK DONE
Residual life estimation of capacitor
Life estimation of electrolytic capacitor using analytical method
Residual life estimation of capacitor using ALT (acceleration life testing) approach
Residual life estimationof resistor
Residual life estimation of resistor using Acceleration life testing
Residual life estimation of resistor using artificial intelligence modeling
Residual life estimation of Diode
Residual life estimation of diode using ALT (acceleration life testing) method
Life prediction of diode using expert artificial intelligence modeling
Design of decision support system
CHAPTER
RESULTS AND DISCUSSION
Residual life estimation of capacitor using analytical method
Residual life of electrolytic capacitor obtained using artificial intelligence modeling
Residual life of electrolytic capacitor obtained using artificial neural network model
Residual life of electrolytic capacitor obtained using fuzzy model
Residual life of electrolytic capacitor obtained using ANFIS model
Comparison of output life obtained using various techniques
Life estimation of electrolytic capacitor using experimental method (using ALT)
Fuzzy based decision support system interfaces for electrolytic capacitor
Fuzzy based decision support system interfaces for resistor
Residual life estimation of diode using experimental method (ALT)
Fuzzy based decision support system interface for diode
CHAPTER
CONCLUSION & FUTURE SCOPE
CHAPTER
CONCLUSION & FUTURE SCOPE
CHAPTER
REFERENCES
ANNEXURE
The primary objective of this research is to develop an intelligent system for predicting the remaining useful life (RUL) of common electronic components—specifically electrolytic capacitors, fixed resistors, and diodes—under various operating conditions to prevent sudden system failures and enhance overall reliability.
RESIDUAL LIFE PREDICTION OF ELECTROLYTIC CAPACITOR
One of the major aspects for electronic engineers regarding capacitor is to predict its remaining useful life in order to protect it from sudden failures and prevent the complete system breakdown. The life of electrolytic capacitors is mostly relies on various environmental and electrical factors where environmental factors are temperature, humidity, atmospheric pressure and vibration and electrical factors are operating voltage, ripple current and dissipation factor.
Out of these factors, temperature (ambient temperature) is the critical factor while estimating the life of aluminum electrolytic capacitors whereas; conditions such as vibration, shock and humidity have little impact on the actual life of the capacitor [7-8].
Lifetime Acceleration Factors
Electrolytic capacitors are by assessed by accelerated life tests. The accelerated life tests contain four components (one for temperature, voltage and ripple current) which are given by the accompanying equation [9-10]:
LP = LT * LV * LR* LVIB * LH
INTRODUCTION: Provides an overview of the importance of residual life prediction in preventing failures and ensuring reliability in integrated electronic systems.
LITERATURE REVIEW: Examines various existing studies and methodologies related to reliability and life prediction, including statistical, analytical, and soft computing approaches.
REVIEW OF BASIC CONCEPTS AND DEVELOPMENT OF METHODOLOGY: Details the fundamental concepts of component life, reliability, and the proposed hybrid intelligent methodology for life estimation.
WORK DONE: Documents the practical application of experimental, analytical, and AI-based models on specific electronic components to gather failure data.
RESULTS AND DISCUSSION: Compares the outcomes of various prediction models (ANN, Fuzzy, ANFIS) with actual failure data and presents the developed decision support interfaces.
CONCLUSION & FUTURE SCOPE: Summarizes findings on the accuracy of different techniques, identifying ANFIS as the superior model, and suggests future research directions.
Residual Life Prediction, Electrolytic Capacitor, Fixed Resistor, Diode, Accelerated Life Testing (ALT), Artificial Neural Network (ANN), Fuzzy Inference System, Adaptive Neuro-Fuzzy Inference System (ANFIS), Reliability, Condition Monitoring, MATLAB, Failure Analysis, Stress Factors, Predictive Maintenance, Intelligent Modeling
The research focuses on developing intelligent methodologies to estimate the Remaining Useful Life (RUL) of electronic components like capacitors, resistors, and diodes to prevent system downtime.
The central themes include reliability engineering, life estimation through accelerated stress testing, and the application of artificial intelligence models to predict component degradation.
The goal is to increase system reliability and reduce costly, unexpected failures by creating an accurate predictive system that considers real-world operating conditions.
The research uses three main approaches: analytical methods (using acceleration factors), experimental methods (Accelerated Life Testing), and machine learning (ANN, Fuzzy Logic, and ANFIS).
The main part covers the formulation of mathematical models, the experimental testing of components, the design of AI-based predictive models in MATLAB, and the development of a user-friendly decision support interface.
Key terms include Residual Life Prediction, Accelerated Life Testing, ANN, Fuzzy Inference System, ANFIS, Reliability, and Component Failure Analysis.
ANFIS combines the self-learning capabilities of ANN with the uncertainty-handling properties of Fuzzy logic, resulting in higher accuracy and fewer prediction errors compared to using the techniques individually.
MATLAB is used as the primary tool to design the intelligent models, implement Fuzzy rule bases, train neural networks, and develop the Graphical User Interface (GUI) for the decision support system.
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